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Reference: RISE
RISE Raman-SEM Correlative Microscope
Fully integrated Raman and scanning electron microscope that links ultra-structural SEM information with molecular compound data on the same sample area.
Key specifications
- Lateral resolution
- 200 - 300 nm
- Ultra-fast imaging option
- 0.76 ms integration time per spectrum
- Image type
- Hyperspectral, full Raman spectrum at every pixel
- Techniques combined
- Confocal Raman imaging (witec360) and scanning electron microscopy
- Configured to your application by our specialists
- Installed and commissioned on site
- Training and after-sales support across Jordan, the GCC and MENA
RISE Raman-SEM Correlative Microscope
Request a quoteOverview
Product overview
RISE (Raman Imaging and Scanning Electron) microscopy combines a stand-alone SEM with the confocal Raman imaging microscope witec360 in one instrument. Samples are transferred automatically between the Raman and SEM positions inside the SEM vacuum chamber, so you can switch quickly without compromising either technique.
Results are controlled from an integrated software interface and can be correlated and overlaid, linking surface ultrastructure to molecular composition. The Raman part offers lateral resolution of 200 to 300 nm, hyperspectral imaging, depth profiling and an ultra-fast option with 0.76 ms integration time per spectrum, with no staining or fixation required.
RISE has applications across materials science, nanotechnology, polymers, geoscience, life science and pharmaceutical work, and received a 2015 Photonics Prism Award.
Specifications
Technical specifications
5 parameters
Raman
- Lateral resolution
- 200 - 300 nm
- Ultra-fast imaging option
- 0.76 ms integration time per spectrum
- Image type
- Hyperspectral, full Raman spectrum at every pixel
Integration
- Techniques combined
- Confocal Raman imaging (witec360) and scanning electron microscopy
- Sample transfer
- Automated within the SEM vacuum chamber
Features
Key features
- 01
Integrated Raman and SEM
Both techniques in one instrument with no compromise in imaging capability.
- 02
Automated sample transfer
Sample moves between measuring positions inside the SEM chamber.
- 03
Correlation and overlay
Integrated software correlates results and overlays images.
- 04
Hyperspectral imaging
Complete Raman spectrum at every image pixel.
- 05
Fast option
Ultra-fast imaging with 0.76 ms integration time per spectrum.
- 06
Non-destructive
No staining or fixation of the sample needed for Raman imaging.
From order to operation
We stay with the instrument after it arrives
Al-Shaker specifies the configuration, documents the system, and supports it across Jordan, the GCC, and MENA.
- 01
Consult
- 02
Plan
- 03
Supply
- 04
Install
- 05
Train
- 06
Support
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Talk to the technical team
Tell us the application. We will specify the system.
Share the workflow, capacity, and compliance constraints. We respond with a recommended configuration, not a generic catalogue list.