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Reference: Ultim Extreme Infinity
Ultim Extreme Infinity Windowless EDS Detector
Windowless EDS detector for nano-characterisation at very low kV and short working distance, with guaranteed C K resolution of 46 eV or better and high light-element sensitivity.
Key specifications
- Detector type
- Windowless EDS
- C K resolution
- 46 eV or better at count rates up to 50,000 cps
- Solid angle
- 7-8x that of a typical 100 mm² conventional EDS detector
- Spatial resolution
- Sub-10 nm element characterisation in an FEG-SEM
- Configured to your application by our specialists
- Installed and commissioned on site
- Training and after-sales support across Jordan, the GCC and MENA
Ultim Extreme Infinity Windowless EDS Detector
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Product overview
Ultim Extreme Infinity is a windowless EDS detector for analysis beyond conventional micro- and nano-analysis. A specially shaped sensor, windowless design, close proximity to the sample, small electron trap and a solid angle 7 to 8 times that of a typical 100 mm² detector provide very high sensitivity.
It enables imaging and elemental analysis under the same nano-resolution conditions (below 3 kV down to 1 kV, hundreds of pA, working distance below 5 mm), reaching sub-10 nm element characterisation in an FEG-SEM and improved detectability for light elements from Be to F. It is also suited to low-damage analysis of beam-sensitive materials such as polymers and biological samples.
Resolution at C K is guaranteed at 46 eV or better up to 50,000 cps, and Tru-Q IQ processing helps resolve difficult low-energy overlaps.
Specifications
Technical specifications
7 parameters
Design
- Detector type
- Windowless EDS
Resolution
- C K resolution
- 46 eV or better at count rates up to 50,000 cps
Geometry
- Solid angle
- 7-8x that of a typical 100 mm² conventional EDS detector
Performance
- Spatial resolution
- Sub-10 nm element characterisation in an FEG-SEM
Operating conditions
- Accelerating voltage
- <3 kV, down to 1 kV
- Working distance
- <5 mm
Detection
- Light elements
- Be to F (Li in special cases)
Features
Key features
- 01
Windowless design
Excellent low-energy performance with guaranteed C K resolution.
- 02
High solid angle
7 to 8x that of a typical 100 mm² detector.
- 03
Imaging conditions
Elemental analysis at the same low kV, current and working distance used for imaging.
- 04
Light elements
Improved detectability of Be to F, including nitrogen and oxygen.
- 05
Low-damage analysis
Suited to beam-sensitive materials such as polymers and biological samples.
- 06
Tru-Q IQ
Helps resolve difficult peak overlaps and display trace elements.
From order to operation
We stay with the instrument after it arrives
Al-Shaker specifies the configuration, documents the system, and supports it across Jordan, the GCC, and MENA.
- 01
Consult
- 02
Plan
- 03
Supply
- 04
Install
- 05
Train
- 06
Support
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Talk to the technical team
Tell us the application. We will specify the system.
Share the workflow, capacity, and compliance constraints. We respond with a recommended configuration, not a generic catalogue list.