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Reference: Vero S
Vero S Atomic Force Microscope
Next-generation AFM building on the Cypher S with QPDI interferometric detection, half the noise floor of any other AFM and scanning 10 to 100 times faster.
Key specifications
- Scan speed
- 10-100x faster than typical AFMs
- Detection technology
- Quadrature Phase Differential Interferometry (QPDI)
- Cantilever detection noise reduction
- Up to 10x or more on many cantilevers
- Upgrade path
- Vero ES and Vero VRS1250
- Configured to your application by our specialists
- Installed and commissioned on site
- Training and after-sales support across Jordan, the GCC and MENA
Vero S Atomic Force Microscope
Request a quoteOverview
Product overview
Vero S builds on the stability and performance of the Cypher S and adds Quadrature Phase Differential Interferometry (QPDI), unique to the Vero family. QPDI measures true tip displacement instead of cantilever angle, avoids crosstalk between vertical and lateral forces and is calibrated by the wavelength of light, which improves the quantification of many AFM measurements.
The mechanical stability and low-drift design support high-resolution imaging, and scans are 10 to 100 times faster than typical AFMs, including nanomechanics, conductive AFM and PFM. SpotOn one-click motorised laser alignment, ModeMaster, GetReal, GetStarted and blueDrive simplify operation.
A full suite of nanomechanical, nanoelectrical and electromechanical modes is available, and the system can be upgraded to the Vero ES for environmental control or the Vero VRS1250 for video-rate imaging.
Specifications
Technical specifications
5 parameters
Performance
- Scan speed
- 10-100x faster than typical AFMs
Detection
- Detection technology
- Quadrature Phase Differential Interferometry (QPDI)
- Cantilever detection noise reduction
- Up to 10x or more on many cantilevers
Upgrade
- Upgrade path
- Vero ES and Vero VRS1250
Warranty
- Standard warranty
- One year comprehensive
Features
Key features
- 01
QPDI detection
Measures true tip displacement and reduces cantilever detection noise.
- 02
High stability
Unmatched mechanical stability and exceptionally low drift.
- 03
Fast scanning
Scans 10 to 100x faster than typical AFMs.
- 04
One-click alignment
Motorised SpotOn laser and detector alignment.
- 05
Wide mode range
Nanomechanical, nanoelectrical and electromechanical modes.
- 06
Upgrade path
Upgradeable to Vero ES and Vero VRS1250.
From order to operation
We stay with the instrument after it arrives
Al-Shaker specifies the configuration, documents the system, and supports it across Jordan, the GCC, and MENA.
- 01
Consult
- 02
Plan
- 03
Supply
- 04
Install
- 05
Train
- 06
Support
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Talk to the technical team
Tell us the application. We will specify the system.
Share the workflow, capacity, and compliance constraints. We respond with a recommended configuration, not a generic catalogue list.